Ph.D. Thesis Colloquium

Dear all,


                                              Ph.D. Thesis Colloquium

 NAME OF THE CANDIDATE      :   Mr. Nishant Goyal

 DEGREE                                           :   Ph.D.

 TITLE OF THE THESIS                :   “Tailoring of fields and development of multipole 

                                                                 expansion in planar ion trap geometries”

 SUPERVISORS                                :    Prof. S. Sampath (IPC) & Prof. Atanu K. Mohanty (IAP)

 DATE & TIME                                 :    Monday, 30th December 2019 at 11:00 A.M.

 VENUE                                              :    Lecture Hall – 1, Dept. of Instrumentation and Applied




     In this thesis, a simulation study on tailoring the fields and development of multipole expansion in planar ion trap geometries is presented. Two different planar trap geometries were considered: the first is a One-Sheet Ion Trap Geometry in which the ions are trapped off-plane and the second is a Two-Sheet Ion Trap Geometry in which the ions are trapped in between the two sheets. Both DC and RF potentials were used to trap ions.

      In the first study, the fields were tailored to obtain linear trapping fields in these two geometries. This was done by splitting the central electrode into segments and applying suitable DC potentials to them. The potentials were computed using the least squares method. The simulations were carried out considering a printed circuit board (PCB) with a Teflon base. The One-Sheet Ion Trap Geometry consists of five electrodes, of which the central electrode is segmented. In Two-Sheet Ion Trap Geometry, each sheet consists of three electrodes, of which the central electrode is segmented.

      The second study develops a multipole expansion to characterize potentials and fields in arbitrary ion trap geometries. The coefficients of the expansion are computed from the surface charge distribution obtained from the Boundary Element Method (BEM). From the multipole expansion, a formula has been derived to estimate the ion oscillation frequency. The agreement between the frequencies obtained by this formula and those obtained from numerical simulation was seen to be reasonably good for four different ion trap geometries.


                                                      ALL ARE WELCOME


Date(s) - 30/12/2019
11:00 am - 12:00 pm

Lecture Hall-1, Dept. of Instrumentation & Applied Physics.
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